MACHINE VISION CAMERA SERIES FOR INLINE INSPECTIONS AND METROLOGY

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D-103

DIAMOND DISPLAY

Metrology cameras optimized for Mura and De-Mura

  • Ultrahigh‑resolution global shutter sensors with DSNU correction for accurate dark and bright field inspections.
  • Optimized for Mura and De‑Mura inspection on LCD, OLED, and MicroLED displays.
  • Compact, customizable CoaXPress cameras with resolutions up to 152 Mp.

D-8_front_view 200x200 for web

DIAMOND UV

Metrology cameras optimized for inline inspection below 400 nm

  • High sensitivity for UV inline inspection below 400 nm.
  • Superior image quality through efficient cooling and calibrated non‑uniformity correction.
  • Fast UV imaging (up to 190 fps) via a high‑throughput CoaXPress interface.

D1.2 customer special 200x200

DIAMOND SWIR

Metrology cameras optimized for inline inspection between 400 and 1700 nm

  • High sensitivity across 400–1700 nm for SWIR inline inspection.
  • Superior image quality via efficient cooling, calibrated non‑uniformity correction, and optional TEC.
  • High‑speed SWIR imaging enabled by a high‑throughput CoaXPress interface..