Ways to increase throughput in semiconductor and electronics inspection

The constant challenge in semiconductor and electronics manufacturing is to increase throughput while also increasing accuracy with shrinking dimensions.  This means in-line inspection and metrology systems must provide 100% analysis at a high precision while maintaining high throughput.  The latest innovations in ultra high-resolution image sensors and subsequent cameras support these goals.  High resolution, high-speed…

Increase Accuracy of Optical 3D Measurements

In semiconductor and electronics manufacturing, there has been a move towards 3D measurements to provide accurate process control of smaller dimensions for higher yield and quality of new packaging technologies.  For example in electronics manufacturing a 2D view from the top only allows for detection of defects such as shifts, rotations, and cracks, but not…