Extreme High full well capacity camera to increase the sensitivity in interferometric microscopy – interview with MIT

Adimec interviews Poorya Hosseini of MIT to discuss the use of extreme high full well capacity camera in interferometric microscopy Optics Letters recently published a paper titled “Pushing phase and amplitude sensitivity limits in interferometric microscopy”.  For this research, the Adimec high full well (HFW) Q-2HFW-CXP camera was used.  The new 2 Megapixel CoaXPress camera (Q-2HFW-CXP)…

FFC part 3 – How to use Flat Field Correction in practice?

Flat Field Correction (FFC) in cameras for Machine Vision Part 3 As we have discussed in previous articles, elsewhere on our blog, various types of flat field correction (FFC) exist. Depending on the variant, a flat field correction corrects for dark signal non-uniformities (DSNU), photo response non-uniformities (PRNU) and/or artifacts caused by the illumination and illumination…

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FFC part 1 – How to remove light source and illumination optics artifacts from your camera image

Flat Field Correction (FFC) in cameras for Machine Vision Part 1 This is the first in a series of articles about using Flat Field Correction in high-resolution Machine Vision cameras. ARTIFACTS IN IMAGES In a Machine Vision inspection system you might use multiple light sources and/or multiple lenses. They might be switched on all at…

FFC part 2 – Which types of flat field corrections exist and why it matters for high resolution cameras?

Flat Field Correction (FFC) in cameras for Machine Vision Part 2 Flat field correction is a widely used term as a lot of industrial and machine vision cameras have some form of correction algorithms to overcome image artifacts. However not all forms of flat field correction are the same and with the growing amount of…