Semiconductor front-end

Cameras for semiconductor wafer metrology

By designing machine vision cameras especially for optical inspection and metrology systems, Adimec helps equipment manufacturers to increase throughput and detection capabilities of their system. Through close partnerships, we fine-tune high-end vision products to support the innovations of our customers. Depending on the measurement method used, this involves extracting the highest quality out of CCD cameras and pushing the speed limits of CMOS cameras. Our cameras are relied on 3D metrology algorithms such as 3D-Interferometry, 3D-triangulation and 3D-phase shift equipment.

Since any variation in the vision system is directly reflected in the yield from the wafer fab, our reliable cameras deliver repeatable quality over time and temperature.

Detect smaller features and increase wafer throughput

Faster, Better, Cheaper is our continuous goal.

Detect smaller features

Adimec has delivered thousands of cameras per year for use in semiconductor process control systems. We take care in our camera designs and proprietary image detection processing to facilitate accurate registration of the smallest details. With high dynamic range, high sensitivity and high image uniformity, Adimec’s Machine Vision cameras produce excellent images that enable systems to meet ever-increasing in-line evaluation requirements.

Increase wafer throughput

We are always working to get the fastest frame speeds without any compromise in image quality. Technology such as burst mode, CoaXPress and region of interest (ROI) help with efficiency.

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