Q-21A230x/CXP-PA
High Speed Metrology Camera
The QUARTZ Q-21A230x/CXP-PA camera, or in short the Q-21 Performance, delivers the best image quality at 228.8 fps combined with optimal heat management, which makes it the perfect fit for Semiconductor Metrology applications.
- Gpixel GSPRINT4521 sensor
- 5120 x 4096 pixels at 228.8 fps
- Dynamic range > 68.7 dB
- No active cooling required
- Optimized for tool matching
- Different operating modes for specific application requirements
- Adimec Connect & Grab™ – easy system integration
Sensor
- GPIXEL GSPRINT4521
- Optical format: 29.5 mm
- Resolution: 5120 (H) x 4096 (V)
- Pixel size: 4.5 x 4.5 μm
- Sensor bit depth: 12 bit
- Global shutter CMOS
Monochrome / Color choices
- Monochrome
- Color
- Removable cover glass (monochrome)
Interface
- CoaXPress – CXP 3/6/10/12
- 2 and 4 lanes configurable
Framerate
- 228.8 fps
Performance
- Dynamic range: > 68.7 dB
- Full well: 33.6 ke-
Operating modes
- Maximum full well
- High full well
- Maximum dynamic range
- High sensitivity
Functionality highlights
- Defect pixel correction
- Factory calibrated uniformity correction
- Low Frequency Flat Field Correction
- Sensitivity matching
- User data storage
Output resolution
- 8, 10 or 12 bit
Image acquisiton
- Continuous or controlled
Triggering
- Internal or external
Dimensions
Weight
- Camera excl. lensmount: 600 g
- Heatsink: < 75 g
- Heatsink and fan: < 100 g
Power
- Input voltage: 2 x 24 Vdc PoCXP
- Power dissipation: typ. 16 W
Operating temperature
- Sensor temperature: +5°C to +70°C, or
- Maximum housing temperature: 50°C
Reliability
- MTBF > 75000 h @ 30°C
Compliance
- CE
- ROHS
Testing
- Every camera is 100% tested on all specifications
Accessories
Standard
- No accessories
Optional
- Heatsink
- Heatsink and fan
- Fn-mount
- M42-mount fixed
- Other lensmounts available on request
- Machine Vision Portfolio brochure
- Datasheet
- Framerate calculator
- Compatible CoaXPress Frame grabbers*
*Check if the 1X-2YE tap geometry is supported by the frame grabber manufacturer.
APPLICATIONS

semiconductor metrology

Wafer inspection

Bump inspection

RDL inspection
