Q-12A180 4.0 CXP camera

Q-12A180-Fx/CXP-6

High Speed Metrology Camera

The QUARTZ Q-12A180 CoaXPress camera delivers 4096 x 3072 high-quality pixels, making it ideal for real-time metrology applications. With its 12 megapixel resolution and a measurement speed of 187 fps, the Q‑12A180 significantly improves your system’s precision and throughput.

  • AMS CMV12000 sensor
  • 4096 (H) x 3072 (V)
  • No active cooling required
  • Pixel based non-uniformity correction
  • Optimized for tool matching
  • Teledyne Adimec Connect & Grab™ for easy system integration

Uniformity in dark

icon image sensor

Active sensor alignment

Device-to-device repeatability

Specifications

Sensor
  • CMV12000
  • Optical size: APS-C (28.1 mm)
  • Resolution: 4096 (H) x 3072 (V)
  • Pixel size: 5.5 x 5.5 μm
  • Global shutter CMOS
Monochrome / Color choices
  • Monochrome
  • Color
Interface
  • CoaXPress – CXP 3/6
  • 1, 2 or 4 lanes configurable
Framerate
  • 187 fps
Performance
  • Dynamic range: >60 dB
  • Full well: 13.5 ke-
Image acquisition
  • Continuous or controlled
Triggering
  • Internal or external
Functionality highlights
  • Defect pixel correction
  • Pixel based DSNU correction
  • Low Frequency Flat Field Correction
  • Sensitivity matching
Output resolution
  • 8 / 10 / 12 bit bit
Dimensions

Weight
  • Camera excl. lensmount: 400 g
Power
  • Input voltage: 24 Vdc nominal, range
  • < 13 W @ 24 Vdc full continuous operation at maximal framespeed
Operating temperature
  • Ambient temperature: 0°C  to +30°C, or
  • Maximum housing temperature: 50°C 
Reliability
  • MTBF > 75000 h @ 30°C  
Testing

Every camera is 100% tested on all specifications

Accessories
  • F-Mount
  • T2 -Mount
  • EF-Mount
  • M42-Mount
  • TFL-II Mount

APPLICATIONS

semiconductor microchip
semiconductor metrology
wafer-500x500
Wafer inspection
Wafer inspection
Bump inspection
advanced-packaging
RDL inspection
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