Ways to increase throughput in semiconductor and electronics inspection

The constant challenge in semiconductor and electronics manufacturing is to increase throughput while also increasing accuracy with shrinking dimensions.  This means in-line inspection and metrology systems must provide 100% analysis at a high precision while maintaining high throughput.  The latest innovations in ultra high-resolution image sensors and subsequent cameras support these goals.  High resolution, high-speed…

3D Metrology OEM Camera Requirements

As the objects to inspect/measure in high-tech manufacturing become smaller, higher-resolution cameras with better spatial resolution can improve accuracy and precision.  This requires a high-quality machine vision camera design, or what is now called a metrology camera.  3D measurements in particular pose increasing demands on camera performance and reliability.