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Daily Archives: November 17, 2011

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Machine Vision Camera Parameters for 3D

Semiconductor front endBy Gretchen AlperNovember 17, 2011Leave a comment

There are many camera specifications that drive accuracy.  How do you avoid paying too much for excellent image quality?  Our short presentation (only 20 slides) will provide you with some background information on 3D measurements and the machine vision camera parameters to consider when moving to 3D.

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