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Monthly Archives: 10月 2017

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  2. 2017
  3. 10月

High-resolution CoaXPress cameras with image processing for expanded networking capabilities

UncategorizedBy 10月 13, 2017Leave a comment

The BASTION project was initiated on April 1, 2014 with the main of objective to research and develop new appl…

3D Metrology OEM Camera Requirements

UncategorizedBy 10月 13, 2017Leave a comment

As the objects to inspect/measure in high-tech manufacturing become smaller, higher-resolution cameras with be…

Adimec’s Industrial Imaging and Machine Vision Blog: Best of 2014 so far

UncategorizedBy 10月 13, 2017Leave a comment

Hopefully our blog has been a source of helpful informa…

Sneak Peak of Adimec’s new high resolution camera for industrial metrology

UncategorizedBy 10月 13, 2017Leave a comment

Adimec provides a sneak peak at our new OEM camera for industrial metrology that will be unveiled at the Visio…

Are frame grabbers ready for QUAD CoaXPress (4 x CXP-6) with a speed of 25 Gbits/sec?

UncategorizedBy 10月 13, 2017Leave a comment

The great answer is yes!  There have been many more CoaXPress frame grabbers made available this year.&nb…

How Active Sensor Control Provides Reliable Pixel Data for Metrology Cameras

UncategorizedBy 10月 13, 2017Leave a comment

The benefits of greater accuracy and throughput from high-resolution cameras can only be realized if the …

How metrology cameras with high speed combined with high image quality improve accuracy

UncategorizedBy 10月 13, 2017Leave a comment

We have talked about how high resolution, high-speed metrology cameras can improve accuracy and throughput for…

New QUAD CoaXPress High Speed Area Scan Camera

UncategorizedBy 10月 13, 2017Leave a comment

This week we announced a new QUAD CoaXPress 1.1 high-speed area scan camera.  This addition to the family…

Metrology equipment upgrade considerations with increasing to high-resolution cameras

UncategorizedBy 10月 13, 2017Leave a comment

High resolution, high-speed metrology cameras can be a great way to increase accuracy and throughput of equipm…

Camera Requirements for 3D Metrology

UncategorizedBy 10月 13, 2017Leave a comment

The increasing trend from 2D measurements to 3D in semiconductor and electronics metrology and inspection syst…

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