{"id":1914,"date":"2017-10-13T22:44:54","date_gmt":"2017-10-13T20:44:54","guid":{"rendered":"https:\/\/www.adimec.com\/high-resolution-cameras-combined-with-high-speeds-support-latest-smartphones-production-demand-part-2\/"},"modified":"2018-07-27T17:13:25","modified_gmt":"2018-07-27T15:13:25","slug":"high-resolution-cameras-combined-with-high-speeds-support-latest-smartphones-production-demand-part-2","status":"publish","type":"post","link":"https:\/\/www.adimec.com\/ja\/high-resolution-cameras-combined-with-high-speeds-support-latest-smartphones-production-demand-part-2\/","title":{"rendered":"High-resolution cameras combined with high speeds support latest smartphones production demand, part 2"},"content":{"rendered":"
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Higher resolution cameras combined with high speeds allow for greater throughput and accuracy required by manufacturers of semiconductor packaging inspection equipment supporting smartphone production demand.<\/b><\/p>\n

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While companies like Samsung and Apple are responding to and feeding the consumers’ demands for more and better smartphones and tablets, the semiconductor manufacturing industry has grown<\/a> by focusing on supporting them.<\/p>\n

To increase the capabilities of smartphones, more powerful processors are required with higher density chips.  This presents new challenges for manufactures of inspection and metrology<\/a> equipment as smaller features must be detected without compromises in throughput to help sustain or improve yield<\/a>. Machine vision cameras<\/a> taking advantage of the latest CMOS global shutter image sensors<\/a> with high resolution combined and high speeds allow for a response to these changes.<\/p>\n

With semiconductor back-end manufacturing<\/a>, there are changes in packaging such as flip chip<\/a> technology, which offers significant size savings.  The trend towards continuous miniaturization results in smaller bump sizes and a greater number of bumps.  This combined with the goal of 100% analysis at a high precision while maintaining high throughput; challenges bump inspection and component inspection equipment manufacturers.<\/p>\n

Optical Bump Inspection Equipment verify:
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